International Symposium on SIMS in Japan

SIMS XVI, 2007, Kanazawa
[SIMS XVI Index]
Applied Surface Science 255(4), 2008

SISS-13

Scope

Date

Time Table (PDF file)

Guideline

Committee

Japanese

Kudo Laboratory
Seikei University

The previous SIMS symposiums "SISS12"

The past SIMS symposiums in Japan

SIMS workshop (USA)

MVA & Chemometrics for TOF-SIMS Users (in Japanese)

The International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions at Seikei University (SISS-13)
SISS-13 will be held at Toyota Central R&D Labs., Inc., in Nagoya area.

Scope:
SISS-13 will cover SIMS and related techniques based on ion-solid interactions: fundamentals, instrumentation, and application in various fields, such as semiconductors, industrial materials, biological, medical, and environmental sciences. This symposium will be held as a pre-conference of SIMS-XVIII. In this time, we will have mainly three sessions: Atom Probe, D-SIMS, and TOF-SIMS.

The location of SISS-13 has been changed to Toyota Central R&D Labs., Inc., in Nagoya area. The new place is located 400 km west of Tokyo and is near to an international airport called Centrair airport which has direct airlines to many places including Detroit, Frankfurt, Helsinki, Hong Kong, Beijing, Seoul and Pusan.

Date: June 23 and 24, 2011

Place: Toyota Central R&D Labs., Inc.,, Aichi (Nagoya Area)
(Social meeting: June 23, 2011 at evening)

Lunch on 24th (Fri)
Please reserve your lunch box in advance. There are few restaurants around the symposium site.
E-mail:

(Satoka Aoyagi, Shimane University)

Invited Talks:
Prof. Kazuhiko Fukushima, Nagoya University, Japan
"Application of TOF-SIMS to the direct determination of plant components and introduction of CryoTOF-SIMS/SEM complex apparatus"
Prof. Ian Gilmore, National Physical Laboratory, UK
"Watching chemistry in 3D & hi-definition using SIMS - from nanostructures to informatics"
"Ambient surface mass spectrometry - developing the metrology for reliable and repeatable measurement"
Dr. Yuji Kataoka, Fujitsu, Japan
"SIMS Depth Profiling of Ultra Shallow Implants with Oxygen Primary Ions"
Dr. Tae Geol Lee, Korea Research Institute of Standard and Science, Korea
"ToF-SIMS Imaging Analysis of Biological Samples"
Dr. Xian-hua Li, Institute of Geology and Geophysics, Chinese Academy of Sciences, China
"Precise baddeleyite Pb/Pb and U/Pb isotopic age determination by Cameca 1280 SIMS"
Prof. Jiro Matsuo, Kyoto University, Japan
"Organic and Biological Material Analysis with Cluster Ion Beams"
Prof. Chan Gyung Park, Pohang University of Science and Technology, Korea
"Combined Analyses of Atom probe tomography and nano-SIMS for the Interface Segregation in Steels"
Prof. Mitsutoshi Setou, Hamamatsu University School of Medicine, Japan
"Clinical applications of SIMS and MALDI-IMS"
Dr. Igor Veryovkin, Argonne National Laboratory, US
"Multi-element quantitative analysis of Genesis solar wind collectors with Resonance Ionization Mass Spectrometer"
Prof. Hisayoshi Yurimoto, Hokkaido University, Japan
"SIMS analysis of extraterrestrial materials including the HAYABUSA mission samples"

SISS Registration:

Registration Fee: 5000 yen (Student: 2000 yen)

Guideline for presenters:
All invited and contributed presenters are expected to write abstracts. Please send a MS-Word or PDF file of your abstract (A4 page size, no page limitation) to the committee by e-mail, no later than May 1st, 2011. The abstract should be accompanied by a cover letter stating the title, name, address, e-mail address.

Contact us: (Satoka Aoyagi, Shimane University)

Organizing Committee:

Chair: Masahiro Kudo (Seikei University), Satoka Aoyagi (Shimane University)

Program Coordinator:

Chair: Atsushi Murase (Toyota Central R&D Labs.)

Syunichi Hayashi (Nippon Steel)

Nobuhiko Kato (Seikei University)

Manabu Komatsu (Canon)

Teiichiro Kono (Asahi Kasei)

Masashi Nojima (Tokyo University of Science)

Akio Takano (NTT-AT)

Mitsuhiro Tomita (Toshiba)

Hisayoshi Yurimoto (Hokkaido University)